Course detail
Methods of Structure Analysis
FSI-WA1 Acad. year: 2020/2021 Summer semester
The course covers the folowing topics (with various degree of detail):
light microscopy, image analysis, laser scanning confocal microscopy (CLSM), common elements and functional blocks of electron microscopes, electron-matter interaction, scanning electron microscopy (SEM), special techniques in SEM, overview of methods of local chemical composition analysis, energy-dispersive spectroscopy (EDS), wave-dispersive spectroscopy (WDS), X-ray fluoerescence (XRF) and micro-XRF, cathodoluminescence spectroscopy (CL), electron backscatter difraction (EBSD), focused ion beam microscopy (FIB), transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM), sample preparation techniques for SEM and TEM, diffraction- and scattering-based techniques utilizing X-rays
Language of instruction
Czech
Number of ECTS credits
5
Supervisor
Learning outcomes of the course unit
Students will learn the principles, application range and limitations of the basic methods for structural and phase analyses, including samples' extraction and preparation. Based on this knowledge, the student should be able to select appropriate analytical techniqe to solve practical problems in material engineering.
Prerequisites
Requirements on previous knowledge is: physics basics (mechanics, electricity, magnetism and quantum theory) and mathematics (differential, integral and matrix calculus, statistics) as provided during BSc studies. Further, the knowledge on solid matter physics and crytsallography is required (crystal systems/lattices, reciprocal space, kinematic and dynamic diffraction theory, pole figure, basic stereographic triangle).
Planned learning activities and teaching methods
The course is taught through lectures explaining the basic principles and theory of the given technique. Teaching is suplemented by practical demonstrations.
Assesment methods and criteria linked to learning outcomes
Exam consists of written and oral part. The course-unit credit is granted under condition of elaboration of the assigned projects.
Aims
The course objective is to offer the students an overview and also the theoretical knowledge on principles of all basic methods for structural and phase analyses (physical principles of methods, instrument parameters, application scope of the methods, etc.), including sample preparation techniques. Based on practical demonstrations, the students will gain basic overview of procedures and methods used to solve problems and analysing results.
Specification of controlled education, way of implementation and compensation for absences
Compulsory attendance at exercises. Absence from classes is dealt with individually, usually by make-up exercises.
The study programmes with the given course
Programme N-MTI-P: Materials Engineering, Master's, compulsory
Programme N-FIN-P: Physical Engineering and Nanotechnology, Master's, compulsory
Type of course unit
Lecture
39 hours, optionally
Teacher / Lecturer
Syllabus
The topics of the subject are going to be lectured in the following indicative order (actual order will be established according to organizational opportunities):
- light microscopy (repetition and broadening of knowledge gained in the subject Introduction to Material Science and Engineering – BUM)
- image analysis
- laser scanning confocal microscopy (CLSM)
- common elements and functional blocks of electron microscopes
- electron-matter interaction
- scanning electron microscopy (SEM)
- special techniques in SEM, high resolution SEM
- overview of methods of local chemical composition analysis
- energy-dispersive spectroscopy (EDS)
- wave-dispersive spectroscopy (WDS)
- algorithms of chemical composition quantitation based on EDS/WDS measurement
- X-ray fluoerescence (XRF) and micro-XRF
- cathodoluminescence spectroscopy (CL)
- electron backscatter difraction (EBSD)
- focused ion beam microscopy (FIB)
- transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM)
- spectroscopy techniques in TEM, STEM
- sample preparation techniques for SEM and TEM
- diffraction- and scattering-based techniques utilizing X-rays
Laboratory exercise
26 hours, compulsory
Teacher / Lecturer
Syllabus
Topics of the subject will be tought in the following indicative order. Actual order, eventually also grouping of topics, is subject to opportunities in organizing the practical lessons:
- light microscopy and image analysis
- laser scanning confocal microscopy (CLSM)
- scanning electron microscopy (SEM)
- energy- and wave-dispersive spectroscopy (EDS, WDS)
- electron backscatter difraction (EBSD)
- focused ion beam microscopy (FIB)
- transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM), electron energy loss spectroscopy (EELS) and EDS in TEM
- sample preparation techniques for SEM and TEM
- X-ray diffraction (XRD), phase composition assessment