Course detail

Optical Microscopy and Spectroscopy

FSI-TMK Acad. year: 2023/2024 Winter semester

Introduction to light microscopy (historical overview completed by substantial pieces of knowledge of geometric and wave optics, light-microscope optical setup, basic techniques of light microscopy and practical knowledge), theoretical description of image formation (wave theory of image formation based on the Abbe theory), confocal microscopy (principle, setup of the device, imaging properties), fluorescence microscopy (principle, setup of the device, imaging properties, methods), interference and holographic microscopy (principle, setup of the device, imaging properties), spectroscopic methods, X-ray photoelectron spectroscopy (XPS, principle, setup of the device, parameters), secondary ion mass spectrometry (SIMS, principle, setup of the device, parameters), low-energy ion scattering spectroscopy (LEIS, principle, setup of the device, parameters).
Demonstrations and practical exercises on light microscopy and spectroscopy and on particle spectroscopy are carried out in laboratories.


Language of instruction

Czech

Number of ECTS credits

5

Supervisor

Ing. Daniel Zicha, CSc.

Department

Institute of Physical Engineering

Entry knowledge

Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films, Geometrical and wave optics.

Rules for evaluation and completion of the course

The assessment of a student is made upon his performance in written and oral part of the exam.

The presence of students is monitored by the tutor. Maximum of tolerated absence is 25 %.

Aims

The goal of the course is to provide students an overview of the principle and methods of light microscopy and spectroscopy, and of particle spectroscopy and give them practical experience with relevant devices.
Students will learn about the history and modern techniques and approaches in the field of light microscopy and spectroscopies (light and particle) and fundamental practical experience with relevant devices. Among others, it help them to select their own topic (for diploma or doctoral thesis).

The study programmes with the given course

Programme N-FIN-P: Physical Engineering and Nanotechnology, Master's, compulsory

Programme N-PMO-P: Precise Mechanics and Optics, Master's, compulsory

Type of course unit

 

Lecture

26 hours, optionally

Teacher / Lecturer

prof. RNDr. Radim Chmelík, Ph.D.
Ing. Zbyněk Dostál, Ph.D.
prof. RNDr. Michal Kozubek, Ph.D.
Ing. Filip Ligmajer, Ph.D.
doc. Ing. Pavel Pořízka, Ph.D.
Ing. Hana Uhlířová, Ph.D.
Ing. Petr Viewegh, Ph.D.
Ing. Daniel Zicha, CSc.
doc. Ing. Tomáš Zikmund, Ph.D.

Syllabus

Introduction to microscopy
Theory of imaging
Confocal microscopy
Fluorescence microscopy
Interference and holographic microscopy
Spectroscopic methods
X-ray photoelectron spectroscopy (XPS)
Secondary ion mass spectrometry (SIMS)
Low-energy ion scattering spectroscopy (LEIS)

Laboratory exercise

13 hours, compulsory

Teacher / Lecturer

prof. RNDr. Radim Chmelík, Ph.D.
Ing. Zbyněk Dostál, Ph.D.
prof. RNDr. Michal Kozubek, Ph.D.
doc. Ing. Pavel Pořízka, Ph.D.
Ing. Hana Uhlířová, Ph.D.
Ing. Daniel Zicha, CSc.
doc. Ing. Tomáš Zikmund, Ph.D.

Syllabus

The calculations of supportive theoretical examples take place during the whole semester. Demonstrations and practical exercises in laboratory of optical microscopy, in laboratory of surfaces and thin films.