Course detail
Methods of Structure Analysis
FSI-WA1 Acad. year: 2023/2024 Summer semester
The course covers the folowing topics (with various degree of detail):
light microscopy, image analysis, laser scanning confocal microscopy (CLSM), common elements and functional blocks of electron microscopes, electron-matter interaction, scanning electron microscopy (SEM), special techniques in SEM, overview of methods of local chemical composition analysis, energy-dispersive spectroscopy (EDS), wave-dispersive spectroscopy (WDS), X-ray fluoerescence (XRF) and micro-XRF, cathodoluminescence spectroscopy (CL), electron backscatter difraction (EBSD), focused ion beam microscopy (FIB), transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM), sample preparation techniques for SEM and TEM, diffraction- and scattering-based techniques utilizing X-rays
Language of instruction
Czech
Number of ECTS credits
5
Supervisor
Entry knowledge
Requirements on previous knowledge is: physics basics (mechanics, electricity, magnetism and basics of quantum theory) and mathematics (differential, integral and matrix calculus, statistics) as provided during BSc studies. Further, the knowledge on solid matter physics and crystallography is required (crystal systems/lattices, reciprocal space, kinematic and dynamic diffraction theory, pole figure, basic stereographic triangle).
Rules for evaluation and completion of the course
The subject is concluded by an exam. The exam consists of mandatory written part and may be extended by oral one. The course-unit credit is granted under condition of elaboration of the assignments based on the practical lessons' topics.
Attendance at practical lessons is compulsory. Absence from classes is dealt with individually, usually by make-up exercises.
Aims
The course objective is to offer the students an overview and also the theoretical knowledge on principles of all basic methods of analysis of structure and phase composition of materials, including necessary sample preparation techniques. Based on practical demonstrations, the students will gain basic overview of procedures and methods used to solve problems and analysing results.
After concluding the course, the student should be able to select appropriate analytical techniqe to solve practical problems in materials' engineering.
The study programmes with the given course
Programme N-MTI-P: Materials Engineering, Master's, compulsory
Programme N-FIN-P: Physical Engineering and Nanotechnology, Master's, compulsory
Type of course unit
Lecture
39 hours, optionally
Teacher / Lecturer
Syllabus
The topics of the subject are going to be lectured in the following indicative order (actual order will be established according to organizational opportunities):
- light microscopy (repetition and broadening of knowledge gained in the subject Introduction to Material Science and Engineering – BUM)
- image analysis
- laser scanning confocal microscopy (CLSM)
- common elements and functional blocks of electron microscopes
- electron-matter interaction
- scanning electron microscopy (SEM)
- special techniques in SEM, high resolution SEM
- overview of methods of local chemical composition analysis
- energy-dispersive spectroscopy (EDS)
- wave-dispersive spectroscopy (WDS)
- algorithms of chemical composition quantitation based on EDS/WDS measurement
- X-ray fluoerescence (XRF) and micro-XRF
- cathodoluminescence spectroscopy (CL)
- electron backscatter difraction (EBSD)
- focused ion beam microscopy (FIB)
- transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM)
- spectroscopy techniques in TEM, STEM
- sample preparation techniques for SEM and TEM
- diffraction- and scattering-based techniques utilizing X-rays
Laboratory exercise
26 hours, compulsory
Teacher / Lecturer
Syllabus
Topics of the subject will be tought in the following indicative order. Actual order, eventually also grouping of topics, is subject to opportunities in organizing the practical lessons:
- light microscopy and image analysis
- laser scanning confocal microscopy (CLSM)
- scanning electron microscopy (SEM)
- energy- and wave-dispersive spectroscopy (EDS, WDS)
- electron backscatter difraction (EBSD)
- focused ion beam microscopy (FIB)
- transmission electron microscopy and scanning transmission electron microscopy (TEM,STEM), electron energy loss spectroscopy (EELS) and EDS in TEM
- sample preparation techniques for SEM and TEM
- X-ray diffraction (XRD), phase composition assessment