Course detail
Bases of Scientific Metrology and Quality Control
FSI-9ZVM Acad. year: 2024/2025 Both semester
The subject is aimed at mastering the basics of scientific metrology, theory of measurement errors and uncertainties. Students will familiarize themselves with methods of process control, system and statistical analysis applicable in management of businesses and subordinate processes. Students will also understand the rules for process identification and selection of statistical variables of serial and job production. Students will master the rules of data collection and sorting, data analysis and their use for statistical process control.
Language of instruction
Czech
Supervisor
Entry knowledge
Knowledge of fundamentals of metrology, manufacturing technology and materials, knowledge of physics and applied statistics, basic knowledge of quality control.
Rules for evaluation and completion of the course
Examination from the field of this cource curriculum and its application in the semestral work.
The subject is carried out as lectures and consultations, attendance is controlled.
Aims
The goal of the subject “Basics of scientific metrology and quality control” is the acquisition of theoretical and practical knowledge of scientific metrology and quality management systems in a way, that enables the PhD students to independently solve scientific tasks in this area.
The student will gain extensive and complex knowledge of scientific metrology and quality management systems, which will enable them to solve related problems in industrial practice with erudition.
The study programmes with the given course
Programme D-KPI-P: Design and Process Engineering, Doctoral, recommended course
Programme D-KPI-K: Design and Process Engineering, Doctoral, recommended course
Type of course unit
Lecture
20 hours, optionally
Syllabus
1. Introduction to scientific metrology, system of metrological
confirmation.
2. Measurement errors and their elimination.
3. Measurement trueness and precision, repeatability and reproducibility.
4. Measurement uncertainty in ISO GPS.
5. Statistical tools in metrology
6. Statistical process control. General rules for SPC.
7. Control charts for variables.
8. Process capability. Indexes of shortterm and longterm capability.
9. Measurement capability.
10. Control charts for attributes.