Czech

prof. RNDr. Jiří Spousta, Ph.D.

Institute of Physical Engineering

Knowledge on fundamentals of quantum mechanics, theory of electromagnetic field, and solid state physics is expected.

The course is completed with discussion especially on questions associated with topics of the PhD thesis.
The attendance is checked.

The aim of the course is to provide a survey of various methods for imaging and diagnostics of 1D and 0D nanostructures not only from the morphological and structural point of view, but also making possible to measure local electronic, optical, transport, and magnetic properties of nanostructures.
PhD student is offered to acquire an overview on current knowledge and contemporary methods used in the modern field of Diagnostics of nanostructures.

Programme D-FIN-P: Physical Engineering and Nanotechnology, Doctoral, recommended course

20 hours, compulsory

Introduction to scanning probe microscopy (SPM); scanning tunneling microscopy (STM) – principles of imaging using tunneling current and measurement modes; scanning force microscopy (SFM) – types of forces and measurement modes; atomic force microscopy (AFM); magnetic force microscopy (MFM); electric force microscopy (EFM) and Kelvin probe force microscopy (KPFM); scanning near-field optical microscopy (SNOM); other types of SPM; principles of construction of SPM; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM, etc.); optical and spectroscopic methods (e.g. confocal scanning Raman spectroscopy and photoluminescence spectroscopy and photoluminescence); X-ray photoelectron spectroscopy (XPS); secondary ion mass spectrometry (SIMS); low energy ion scattering (LEIS); combined methods (e.g. STL, cathodoluminescence, TERS, etc.).