Publication detail
Application of AFM in Microscopy and in Fabrication of Micro/Nanostructures
LOPOUR, F. ŠIKOLA, T. SPOUSTA, J. KALOUSEK, R. MATĚJKA, F. ŠKODA, D.
English title
Application of AFM in Microscopy and in Fabrication of Micro/Nanostructures
Type
conference paper
Language
en
Original abstract
In the paper AFM studies of microstructures etched by ion beams into Si and Au surfaces, and AFM local anodic oxidation of Ti thin films is presented. Using the AFM technique the etching limits of inert atoms in production of silicon and silver grids were found. It was proved that the height of Ti oxide lines fabricated by AFM increases linearly with the voltage between a tip and a sample. On the other hand, the half-width of the lines did not depend linearly on this voltage. The results are useful for studies of quantum effects in nanostructures and experiments in fabrication of nanoelectronic devices (e.g. SET).
English abstract
In the paper AFM studies of microstructures etched by ion beams into Si and Au surfaces, and AFM local anodic oxidation of Ti thin films is presented. Using the AFM technique the etching limits of inert atoms in production of silicon and silver grids were found. It was proved that the height of Ti oxide lines fabricated by AFM increases linearly with the voltage between a tip and a sample. On the other hand, the half-width of the lines did not depend linearly on this voltage. The results are useful for studies of quantum effects in nanostructures and experiments in fabrication of nanoelectronic devices (e.g. SET).
Keywords in English
AFM fabrication, local anodic oxidation, oxide nanostructures
RIV year
2001
Released
30.09.2001
Publisher
P. Marcus, A. Galtayries, N. Frémy
Location
Avignon, France
Book
9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts
Pages count
1
BIBTEX
@inproceedings{BUT6953,
author="Filip {Lopour} and Tomáš {Šikola} and Jiří {Spousta} and Radek {Kalousek} and František {Matějka} and David {Škoda},
title="Application of AFM in Microscopy and in Fabrication of Micro/Nanostructures",
booktitle="9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts",
year="2001",
month="September",
publisher="P. Marcus, A. Galtayries, N. Frémy",
address="Avignon, France"
}