Publication detail

Development of the program EOD for design in electron and ion microscopy

ZLÁMAL, J. LENCOVÁ, B.

Czech title

Vývoj programu EOD sloužícího k designu v elektronové a iontové mikroskopii

English title

Development of the program EOD for design in electron and ion microscopy

Type

journal article - other

Language

en

Original abstract

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

Czech abstract

Článek se zabývá popisem nejnověších možností programu EOD – integrace prostorového náboje, ingterakce svazku s plynem a rozladění optiky.

English abstract

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

Keywords in Czech

Metoda konečných prvků; Tolerance; Uživatelské rozhraní

Keywords in English

Finite elementmethod; Tolerancing; User interface

RIV year

2011

Released

21.07.2011

ISSN

0168-9002

Journal

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Volume

645

Number

1

Pages from–to

278–282

Pages count

5

BIBTEX


@article{BUT72696,
  author="Jakub {Zlámal} and Bohumila {Lencová},
  title="Development of the program EOD for design in electron and ion microscopy",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT",
  year="2011",
  volume="645",
  number="1",
  month="July",
  pages="278--282",
  issn="0168-9002"
}