Publication detail
An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum
MACH, J. ŠAMOŘIL, T. VOBORNÝ, S. KOLÍBAL, M. ZLÁMAL, J. SPOUSTA, J. DITTRICHOVÁ, L. ŠIKOLA, T.
Czech title
Nízkoenergiový (30–200 eV) iontově-atomární zdoj pro depozici s asistecí iontového svazku za podmínek velmi vyského vakua.
English title
An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum
Type
journal article - other
Language
en
Original abstract
The paper describes the design and construction of an ion-atomic beam source with an optimized generation of ions for ion-beam-assisted deposition under ultrahigh vacuum (UHV) conditions. The source combines an effusion cell and an electron impact ion source and produces ion beams with ultra-low energies in the range from 30 eV to 200 eV. Decreasing ion beam energy to hyperthermal values (101 eV) without loosing optimum ionization conditions has been mainly achieved by the incorporation of an ionization chamber with a grid transparent enough for electron and ion beams. In this way the energy and current density of nitrogen ion beams in the order of 101 eV and 101 nA/cm2, respectively, have been achieved. The source is capable of growing ultrathin layers or nanostructures at ultra-low energies with a growth rate of several MLs/h. The ion-atomic beam source will be preferentially applied for the synthesis of GaN under UHV conditions
Czech abstract
Článek popisuje vyvinutý nízkoenergiový (30–200 eV) iontově-atomární zdoj pro depozici s asistecí iontového svazku za podmínek velmi vyského vakua.
English abstract
The paper describes the design and construction of an ion-atomic beam source with an optimized generation of ions for ion-beam-assisted deposition under ultrahigh vacuum (UHV) conditions. The source combines an effusion cell and an electron impact ion source and produces ion beams with ultra-low energies in the range from 30 eV to 200 eV. Decreasing ion beam energy to hyperthermal values (101 eV) without loosing optimum ionization conditions has been mainly achieved by the incorporation of an ionization chamber with a grid transparent enough for electron and ion beams. In this way the energy and current density of nitrogen ion beams in the order of 101 eV and 101 nA/cm2, respectively, have been achieved. The source is capable of growing ultrathin layers or nanostructures at ultra-low energies with a growth rate of several MLs/h. The ion-atomic beam source will be preferentially applied for the synthesis of GaN under UHV conditions
Keywords in Czech
iontově atomární zdroj; IBAD; GaN
Keywords in English
ion-atomic source; IBAD; GaN
RIV year
2011
Released
15.08.2011
ISSN
0034-6748
Volume
82
Number
8
Pages from–to
083302-1–083302-7
Pages count
7
BIBTEX
@article{BUT75796,
author="Jindřich {Mach} and Tomáš {Šamořil} and Stanislav {Voborný} and Miroslav {Kolíbal} and Jakub {Zlámal} and Jiří {Spousta} and Libuše {Dittrichová} and Tomáš {Šikola},
title="An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum",
year="2011",
volume="82",
number="8",
month="August",
pages="083302-1--083302-7",
issn="0034-6748"
}