Czech

5

Ing. Ondřej Man, Ph.D.

Institute of Materials Science and Engineering

Students will have a general overview in selected areas and a more in-depth knowledge of the methods of studying structure, substructures, phase and chemical composition of materials.

The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of a of the Bachelor´s degree of mechanical engineering study.

The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.

The exam has a written and an oral part. Awarding the course-unit credit is conditional on submitting written reports on assigned topics.

The course objective is to make students familiar with the basic methods of structural and phase analyses, and broadens this knowledge to cover methods used in fundamental research as well as methods used in metallurgical analyses and engineering (spectroscopic methods). The objective is to prepare future materials specialists for a quick analysis of an optimum choice of the solving method of a given operation problem or solving problems of both fundamental and applied research.

Compulsory attendance at laboratory exercises and instruction visits. Absence from exercises is dealt with individually, usually by way of make-up assignment.

Programme M2A-P: Applied Sciences in Engineering, Master's
branch M-MTI: Materials Engineering, compulsory

26 hours, optionally

Ing. Ondřej Man, Ph.D.

1.High resolution electron microscopy
2.Electron microscopy of nanoobjects in SEM (and TEM)-problems and solutions ,
3.Special methods of electron microscopy (low energy electron SEM,low voltage TEM,etc.)
4.Ion beam microscopy,dual beam microscopy,their using for sample preparation and tomography
5.Lorentz microscopy,
6.Principles and applications of selected methods I (acustic emission,laser)
7.Principles and applications of selected methods II (X-Ray microscopy and topography,etc.)
8.and9.Methods of surface analysis (AES,SIMS,SIPS,XPS)
10.Confocal microscopy, holographic microscopy
11.Mössbauer spectroscopy
12,13 Principles and applications of other selected experimental methods (SAXS,NMR,neutron and proton diffraction,elipsometry,ECP,FIM,etc.)