Course detail
Imaging and Diagnostics of Nanostructures
FSI-9ZDN Acad. year: 2022/2023 Winter semester
Scanning probe microscopy; optical microscopy; electron microscopy; methods for imaging of chemical contrast; combined methods
Language of instruction
Czech
Supervisor
Department
Learning outcomes of the course unit
PhD student is offered to acquire an overview on current knowledge and contemporary methods used in the modern field of Diagnostics of nanostructures.
Prerequisites
Knowledge on fundamentals of quantum mechanics, theory of electromagnetic field, and solid state physics is expected.
Planned learning activities and teaching methods
Classes will have form of series of lectures, alternatively group or individual consultations.
Assesment methods and criteria linked to learning outcomes
The course is completed with discussion especially on questions associated with topics of the PhD thesis.
Aims
The aim of the course is to provide a survey of various methods for imaging and diagnostics of 1D and 0D nanostructures not only from the morphological and structural point of view, but also making possible to measure local electronic, optical, transport, and magnetic properties of nanostructures.
Specification of controlled education, way of implementation and compensation for absences
The attendance is checked.
The study programmes with the given course
Programme D-FIN-K: Physical Engineering and Nanotechnology, Doctoral, recommended course
Programme D-FIN-P: Physical Engineering and Nanotechnology, Doctoral, recommended course
Type of course unit
Lecture
20 hours, compulsory
Syllabus
Introduction to scanning probe microscopy (SPM); scanning tunneling microscopy (STM) – principles of imaging using tunneling current and measurement modes; scanning force microscopy (SFM) – types of forces and measurement modes; atomic force microscopy (AFM); magnetic force microscopy (MFM); electric force microscopy (EFM) and Kelvin probe force microscopy (KPFM); scanning near-field optical microscopy (SNOM); other types of SPM; principles of construction of SPM; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM, etc.); optical and spectroscopic methods (e.g. confocal scanning Raman spectroscopy and photoluminescence spectroscopy and photoluminescence); X-ray photoelectron spectroscopy (XPS); secondary ion mass spectrometry (SIMS); low energy ion scattering (LEIS); combined methods (e.g. STL, cathodoluminescence, TERS, etc.).