Course detail
Methods of Structure Analysis II
FSI-WA2 Acad. year: 2023/2024 Winter semester
The subject is a continuation of Methods of structure analysis I and covers the following topics:
Spectroscopic methods for macroscopic chemical composition assessment of solid matter, electron- and probe-microscopy techniques for surface analysis, spectroscopic techniques for thin layer and surface analyses, selected methods of organic matter analysis, tomography and 3D analytical techniques, methods of study of magnetic properties of materials.
Language of instruction
Czech
Number of ECTS credits
5
Supervisor
Entry knowledge
The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of the Bachelor´s degree of mechanical engineering study.
Rules for evaluation and completion of the course
Awarding the course-unit credit is based on evaluated assignments from practical lessons.
Compulsory attendance at practical lessons and excursions. Absence from exercises is dealt with individually.
Aims
To provide an overview (together with the subject Methods of structure analysis I) of analytical techniques that a material specialist can make use of both in practice and research.
The overwiev on microscopy and analytical techniques for industrial practise shall be extended by knowledge of advanced techniques for research and complex issue assessment.
The study programmes with the given course
Programme N-MTI-P: Materials Engineering, Master's, compulsory-optional
Type of course unit
Lecture
26 hours, optionally
Teacher / Lecturer
Syllabus
Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- macroscopic analytical techniques (introduction)
- optical emission spectroscopy (OES)
- atomic absorption spectroscopy (AAS)
- combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons
- secondary ion mass spectroscopy (SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR)
- scanning probe microscopy (STM, AFM, SNOM)
- combined micro- and spectroscopic methods (TERS, SERS)
- advanced X-ray diffraction and scattering techniques (SAXS, GISAXS, X-ray topography, synchrotrons)
- neutron diffraction
- Mössbauer spectroscopy
- measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography
- destructive tomography techniques (3D FIB)
Laboratory exercise
26 hours, compulsory
Teacher / Lecturer
Syllabus
Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons, secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR), scanning probe microscopy (STM, AFM, SNOM)
- advanced X-ray diffraction and scattering techniques
- Mössbauer spectroscopy, measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography, destructive tomography techniques (3D FIB)