Course detail
Advanced Methods of Electron Microscopy
FSI-9MEM Acad. year: 2025/2026 Winter semester
The interaction of electrons with solids are briefly reviewed with the emphasis given to elastically and inelastically scattered electrons and the origin of characteristic X-rays, which are used for chemical analysis in electron microscopy. The physical origin of image diffraction and phase contrasts in the transmission electron microscope are discussed. Special attention is paid to the formation of Kikuchi line diffraction patterns. In scanning electron microscopy, Kikuchi lines are used for all orientation imaging techniques (OIM /EBSD) which allow us to determine the orientation of grains and to establish the presence of textures. In the case of transmission electron microscopy, Kikuchi line diffraction patterns are used as crystallographic maps which allow to orient single crystals. It will be explained how simple two beam diffraction contrasts can be obtained and a brief introduction into stereographic 3D methods in scanning and transmission electron microscopy will be given. The students will practice all the theoretical concepts themselves by performing exercises at a modern electron microscope.
Language of instruction
Czech
Supervisor
Entry knowledge
Materials analysis methods – basic course
Rules for evaluation and completion of the course
Pass out the Summer school, test of practical microscope operation.
Practical skills of the microscope operation and interpretation of EM images
Lectures and practical excercises at transmission microscopes. Summer school of electron microscopy – seminar combined with practical exercises
Aims
Theoretical background mastering and generation of experimentla skills from direct works and analytical methods applied with advanced electron microscopes.
Practical skills with advanced methods of materials analyses by using transmission microscope techniques.
The study programmes with the given course
Programme D-MAT-P: Materials Sciences, Doctoral, recommended course
Type of course unit
Lecture
20 hours, optionally
Syllabus
1. The interaction of electrons with solids with the emphasis given to elastically and inelastically scattered electrons and the origin of characteristic X-rays.
2. The physical origin of image diffraction and phase contrasts in the transmission electron microscope.
3. Kikuchi line diffraction patterns formation. Kikuchi lines are used for all orientation imaging techniques (OIM /EBSD) in SEM which allow to determine the orientation of grains and to establish the presence of textures. In the case of TEM, Kikuchi line diffraction patterns are used as crystallographic maps which allow to orient single crystals.
4. Simple two beam diffraction contrasts obtaining
5. Brief introduction into stereographic 3D methods in scanning and transmission electron microscopy will be given.
The students will practice all the theoretical concepts themselves by performing exercises at a modern electron microscope.