Course detail
Selected Methods of Structure Analysis
FSI-9VMS Acad. year: 2025/2026 Both semester
In the course, which does not rely on the classical pattern of lectures but rather on consultations, the content is adapted to suit the orientation of the student's dissertation. Within the course, the student acquires the basics of all currently used methods for structure characterization (optical microscopy, transmission and scanning electron microscopy, methods of local chemical analysis in electron microscopy, scanning probe methods, X-ray structural analysis, etc.). The student will learn in depth the methods to be used while working on the dissertation.
Language of instruction
Czech
Supervisor
Entry knowledge
A prerequisite of taking this course is a very good knowledge of materials sciences in their widest scope as obtained in the course of their BSc studies and, in particular, when studying MSc specialization.
Rules for evaluation and completion of the course
Examination: written and oral parts
Teaching is not obligatory and usually is realized in tutorial form.Only in the case of more than five students some lectures are provided
Aims
The objective is to provide the student with a sound overview of methods that are available for structural analysis (morphology, phase and local chemical composition) of metallic and non-metallic materials. In-depth knowledge will be offered about the methods that the student will employ within the experimental work necessary for the preparation of the dissertation.
In-depth knowledge of experimental methods employed in the preparation of the dissertation.
The study programmes with the given course
Programme D-MAT-P: Materials Sciences, Doctoral, recommended course
Type of course unit
Lecture
20 hours, optionally
Syllabus
1. Introduction to structural and phase analyses (imaging and analytical methods).
2. Optical microscopy (methods for increasing the phase contrast).
3. Quantitative evaluation of phases; hardness and microhardness.
4. Introduction to electron microscopy.
5. Structural factor, reciprocal lattice, electron diffraction.
6. High-resolution microscopy, unconventional electron sources, diffraction by convergent beam of electrons.
7. HV transmission electron microscopy, scanning electron microscopy.
8. Environmental scanning electron microscopy, introduction to analytical methods.
9. Energy and wave dispersive spectrometry (EDS and WDS)- general characteristics.
10. Analysis based on electron energy loss spectrometry (EELS), further analytical potentials of electron microscopy.
11. Problems involved in the application of EDS and WDS, ZAF correction, analysis of sub-micron volumes.
12. Image analysis in optical and electron microscopy.
13. Diffraction methods in transmission and scanning electron microscopy.
The selection of experimental methods is adapted to the thematic orientation of the dissertation. Therefore no instruction in the form of lectures given to a group of students is envisaged. Instraction is given in the form of individual consultations.