Publication detail

Analysis of thin films by TOF LEIS

PRŮŠA, S. KOLÍBAL, M. BÁBOR, P. MACH, J. JURKOVIČ, P. ŠIKOLA, T.

Czech title

Analýza tenkých vrstev pomocí ToF LEIS

English title

Analysis of thin films by TOF LEIS

Type

conference paper

Language

en

Original abstract

Structural analysis using TOF LEIS.

Czech abstract

Strukturní analýza pomocí ToF LEIS Spektroskopie.

English abstract

Structural analysis using TOF LEIS.

Keywords in English

TOF LEIS, Ga, thin films

RIV year

2003

Released

23.06.2003

Publisher

EVC

Location

Berlin

Book

EVC'03 Abstracts

Pages count

2

BIBTEX


@inproceedings{BUT11057,
  author="Stanislav {Průša} and Miroslav {Kolíbal} and Petr {Bábor} and Jindřich {Mach} and Patrik {Jurkovič} and Tomáš {Šikola},
  title="Analysis of thin films by TOF LEIS",
  booktitle="EVC'03 Abstracts",
  year="2003",
  month="June",
  publisher="EVC",
  address="Berlin"
}