Publication detail

Measurement of quantum coherence in thin films of molecular quantum bits without post-processing

LENZ, S. KERN, B. SCHNEIDER, M. VAN SLAGEREN, J.

English title

Measurement of quantum coherence in thin films of molecular quantum bits without post-processing

Type

journal article in Web of Science

Language

en

Original abstract

Thin film deposition of molecular quantum bits may further their integration into devices. Current electron paramagnetic resonance equipment is ill-suited for thin film investigations of spin dynamics. We present a 35 GHz Fabry-Perot resonator enabling such measurements and demonstrate its use in the study of different molecular quantum bits.

English abstract

Thin film deposition of molecular quantum bits may further their integration into devices. Current electron paramagnetic resonance equipment is ill-suited for thin film investigations of spin dynamics. We present a 35 GHz Fabry-Perot resonator enabling such measurements and demonstrate its use in the study of different molecular quantum bits.

Keywords in English

SPECTROMETER; SPINS; EPR

Released

02.07.2019

Publisher

ROYAL SOC CHEMISTRY

Location

CAMBRIDGE

ISSN

1359-7345

Volume

55

Number

50

Pages from–to

7163–7166

Pages count

4

BIBTEX


@article{BUT177359,
  author="Samuel {Lenz} and Bastian {Kern} and Martin {Schneider} and Joris {van Slageren},
  title="Measurement of quantum coherence in thin films of molecular quantum bits without post-processing",
  year="2019",
  volume="55",
  number="50",
  month="July",
  pages="7163--7166",
  publisher="ROYAL SOC CHEMISTRY",
  address="CAMBRIDGE",
  issn="1359-7345"
}