Detail publikace

Measurement of quantum coherence in thin films of molecular quantum bits without post-processing

LENZ, S. KERN, B. SCHNEIDER, M. VAN SLAGEREN, J.

Anglický název

Measurement of quantum coherence in thin films of molecular quantum bits without post-processing

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

en

Originální abstrakt

Thin film deposition of molecular quantum bits may further their integration into devices. Current electron paramagnetic resonance equipment is ill-suited for thin film investigations of spin dynamics. We present a 35 GHz Fabry-Perot resonator enabling such measurements and demonstrate its use in the study of different molecular quantum bits.

Anglický abstrakt

Thin film deposition of molecular quantum bits may further their integration into devices. Current electron paramagnetic resonance equipment is ill-suited for thin film investigations of spin dynamics. We present a 35 GHz Fabry-Perot resonator enabling such measurements and demonstrate its use in the study of different molecular quantum bits.

Klíčová slova anglicky

SPECTROMETER; SPINS; EPR

Vydáno

02.07.2019

Nakladatel

ROYAL SOC CHEMISTRY

Místo

CAMBRIDGE

ISSN

1359-7345

Ročník

55

Číslo

50

Strany od–do

7163–7166

Počet stran

4

BIBTEX


@article{BUT177359,
  author="Samuel {Lenz} and Bastian {Kern} and Martin {Schneider} and Joris {van Slageren},
  title="Measurement of quantum coherence in thin films of molecular quantum bits without post-processing",
  year="2019",
  volume="55",
  number="50",
  month="July",
  pages="7163--7166",
  publisher="ROYAL SOC CHEMISTRY",
  address="CAMBRIDGE",
  issn="1359-7345"
}