Publication detail
Digital two-wavelength holographic interference microscopy for surface roughness measurement
OHLÍDAL, M. ŠÍR, L. JÁKL, M. OHLÍDAL, I.
Czech title
Dvouvlnová holografická interferenční mikroskopie pro měření drsnosti povrchu
English title
Digital two-wavelength holographic interference microscopy for surface roughness measurement
Type
conference paper
Language
en
Original abstract
A new approach to surface roughness measurement based on the digital two-wavelength holographic interference microscopy with the synthetic wavelength is presented. Two holograms of a rough surface are recorded step by step at two wavelengths of laser light by means of a CCD camera. Both holograms are numerically superposed and then reconstructed. Two reconstructed digital waves obtained numerically interfere. The surface roughness parameters can be determined from the shape of interference fringes in that interferogram created. The range of measurable height irregularities of the surface is given by the synthetic wavelength, which is indirectly proportional to the difference of the selected wavelengths.
Czech abstract
Je prezentován nový přístup k měření drsnosti povrchu založený na použití digitální dvouvlnové holografické interferenční mikroskopii se syntetickou vlnovou délkou. Dva hologramy náhodně drsného povrchu jsou postupně při dvou vlnových délkách zaznamenány CCD kamerou. Digitální součet obou hologramů je numericky rekonstruován. Rekonstruované digitální vlny spolu numericky interferují. Parametry měřeného drsného povrchu mohou být určeny z tvaru proužků ve vzniklém digitálním interferogramu. Rozsah měřitelné drsnosti povrchu je určen syntetickou vlnovou délkou, která je nepřímo úměrná rozdílu použitých vlnových délek.
English abstract
A new approach to surface roughness measurement based on the digital two-wavelength holographic interference microscopy with the synthetic wavelength is presented. Two holograms of a rough surface are recorded step by step at two wavelengths of laser light by means of a CCD camera. Both holograms are numerically superposed and then reconstructed. Two reconstructed digital waves obtained numerically interfere. The surface roughness parameters can be determined from the shape of interference fringes in that interferogram created. The range of measurable height irregularities of the surface is given by the synthetic wavelength, which is indirectly proportional to the difference of the selected wavelengths.
Keywords in Czech
Digitální dvouvlnová holografická interferenční mikroskopie, měření drsnosti povrchu.
Keywords in English
Digital two-wavelength hologgraphic interferometry, surface roughness measurement
RIV year
2005
Released
01.07.2005
Publisher
SPIE - The International Society for Optical Engineering
Location
Bellingham, Washington, USA
ISBN
0-8194-5951-8
Book
14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics
Pages from–to
59450I-1–59450I-8
Pages count
8
BIBTEX
@inproceedings{BUT20938,
author="Miloslav {Ohlídal} and Luděk {Šír} and Miloš {Jákl} and Ivan {Ohlídal},
title="Digital two-wavelength holographic interference microscopy for surface roughness measurement",
booktitle="14 th Slovak-Czech Polish Conference on Wave and Quantum Aspects of Contemporary Optics",
year="2005",
month="July",
pages="59450I-1--59450I-8",
publisher="SPIE - The International Society for Optical Engineering",
address="Bellingham, Washington, USA",
isbn="0-8194-5951-8"
}