Publication detail

Prognoses and planning in metrology, and the predition application

VAČKÁŘ, J. BUMBÁLEK, L.

English title

Prognoses and planning in metrology, and the predition application

Type

journal article - other

Language

en

Original abstract

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

English abstract

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

Keywords in English

planning in metrology, description of planning operations, determination

RIV year

2002

Released

26.02.2000

ISSN

2000-1213

Volume

28

Number

2

Pages count

6

BIBTEX


@article{BUT41054,
  author="Josef {Vačkář} and Leoš {Bumbálek},
  title="Prognoses and planning in metrology, and the predition application",
  year="2000",
  volume="28",
  number="2",
  month="February",
  issn="2000-1213"
}