Detail publikace

Prognoses and planning in metrology, and the predition application

VAČKÁŘ, J. BUMBÁLEK, L.

Anglický název

Prognoses and planning in metrology, and the predition application

Typ

článek v časopise - ostatní, Jost

Jazyk

en

Originální abstrakt

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

Anglický abstrakt

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

Klíčová slova anglicky

planning in metrology, description of planning operations, determination

Rok RIV

2002

Vydáno

26.02.2000

ISSN

2000-1213

Ročník

28

Číslo

2

Počet stran

6

BIBTEX


@article{BUT41054,
  author="Josef {Vačkář} and Leoš {Bumbálek},
  title="Prognoses and planning in metrology, and the predition application",
  year="2000",
  volume="28",
  number="2",
  month="February",
  issn="2000-1213"
}