Publication detail

Sn-CeO2 thin films prepared by rf magnetron sputtering: XPS and SIMS study

MAŠEK, K. VÁCLAVŮ, M. BÁBOR, P. MATOLÍN, V.

Czech title

Tenké vrstvy Sn-CeO2 připravené magnetronovým naprašováním: studie pomoví XPS a SIMS

English title

Sn-CeO2 thin films prepared by rf magnetron sputtering: XPS and SIMS study

Type

journal article - other

Language

en

Original abstract

Sn addition in the CeO2 thin film by simultaneous Sn metal and cerium oxide magnetron sputtering causes growth of Ce3+ rich films whilst pure cerium oxide sputtering provides stoichiometric CeO2 layers. Ce4+ – Ce3+ conversion is explained by a charge transfer from Sn atoms to unoccupied orbital Ce 4f0 of cerium oxide by forming Ce 4f1 state. XPS and SIMS revealed a formation of a new chemical Ce(Sn)+ state, which belongs to SnCeO2 species.

Czech abstract

Přidání atomů Sn do tenké vrstvy CeO2 při soušasném magnetronovém naprašování Sn CeO2 způsobí růst na Ce3+ bohatých vrstev zatímco při depozice čistého CeO2 vziká stochiometrické CeO2 vrstvy.

English abstract

Sn addition in the CeO2 thin film by simultaneous Sn metal and cerium oxide magnetron sputtering causes growth of Ce3+ rich films whilst pure cerium oxide sputtering provides stoichiometric CeO2 layers. Ce4+ – Ce3+ conversion is explained by a charge transfer from Sn atoms to unoccupied orbital Ce 4f0 of cerium oxide by forming Ce 4f1 state. XPS and SIMS revealed a formation of a new chemical Ce(Sn)+ state, which belongs to SnCeO2 species.

Keywords in Czech

CeO2; Sn-CeO2; SIMS; XPS; Magnetronové naprašování

Keywords in English

Cerium oxide; Tin-cerium mixed oxide; SIMS; XPS; Magnetron sputtering

RIV year

2009

Released

15.04.2009

ISSN

0169-4332

Journal

Applied Surface Science

Volume

255

Number

13-14

Pages from–to

6656–6660

Pages count

5

BIBTEX


@article{BUT47187,
  author="Karel {Mašek} and Michal {Václavů} and Petr {Bábor} and Vladimír {Matolín},
  title="Sn-CeO2 thin films prepared by rf magnetron sputtering: XPS and SIMS study",
  journal="Applied Surface Science",
  year="2009",
  volume="255",
  number="13-14",
  month="April",
  pages="6656--6660",
  issn="0169-4332"
}