Publication detail
Noncontact Scanning Force Microscopy - Principles and Simulations
KALOUSEK, R. ŠIKOLA, T. BUŠ, V. ŠKODA, D.
Czech title
Bezkontaktní rastrovací sondová mikroskopie - principy a simulace
English title
Noncontact Scanning Force Microscopy - Principles and Simulations
Type
conference paper
Language
en
Original abstract
In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.
Czech abstract
Příspěvek se zabývá základními principy bezkontaktní SFM.
English abstract
In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.
Keywords in English
noncontact SFM, nanostructures, interatomic forces
RIV year
2002
Released
15.11.2001
Publisher
FEI VUT v Brně
Location
Brno
ISBN
80-214-1992-X
Book
Sborník příspěvků konference Nové trendy ve fyzice
Pages count
6
BIBTEX
@inproceedings{BUT6498,
author="Radek {Kalousek} and Tomáš {Šikola} and Vladan {Buš} and David {Škoda},
title="Noncontact Scanning Force Microscopy – Principles and Simulations",
booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
year="2001",
month="November",
publisher="FEI VUT v Brně",
address="Brno",
isbn="80-214-1992-X"
}