Detail publikace
Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy
DRUCKMÜLLER, M. OHLÍDAL, I.
Český název
Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy
Anglický název
Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force
Typ
kapitola v knize
Jazyk
cs
Rok RIV
1997
Vydáno
01.01.1994
Nakladatel
JOHN WILEY AND SONS
Místo
CHICHESTER
ISBN
0471978272
Kniha
ECASIA 97
Počet stran
4
BIBTEX
@inbook{BUT53494,
author="Miloslav {Druckmüller} and Ivan {Ohlídal},
title="Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy",
booktitle="ECASIA 97",
year="1994",
month="January",
publisher="JOHN WILEY AND SONS",
address="CHICHESTER",
isbn="0471978272"
}