Detail publikace
Nový program pro návrh elektronových mikroskopů
LENCOVÁ, B. ZLÁMAL, J.
Český název
Nový program pro návrh elektronových mikroskopů
Anglický název
A new program for the design of electron microscopes
Typ
článek v časopise - ostatní, Jost
Jazyk
en
Originální abstrakt
The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.
Český abstrakt
Článek popisuje nový program pro návrh elektronových mikroskopů EOD (Electron Optical Design), který slouží k návrhu elektrových čoček a deflektorů pro rastrovací elektronové mikroskopy.
Anglický abstrakt
The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.
Klíčová slova česky
Metoda konečných prvků; elektronové čočky a deflektory; počítačově podporovaný návrh; uživatelské rozhraní
Klíčová slova anglicky
Finite element method; Electron lenses and deflectors; Computer-aided design; User interface
Rok RIV
2008
Vydáno
29.08.2008
Nakladatel
Elsevier
ISSN
1875-3892
Časopis
Physics Procedia
Ročník
1
Číslo
1
Strany od–do
315–324
Počet stran
10
BIBTEX
@article{BUT48562,
author="Bohumila {Lencová} and Jakub {Zlámal},
title="A new program for the design of electron microscopes",
journal="Physics Procedia",
year="2008",
volume="1",
number="1",
month="August",
pages="315--324",
publisher="Elsevier",
issn="1875-3892"
}