Detail publikace
Užití TOF - LEIS a XPS ke studiu povrchů.
PRŮŠA, S. ŠIKOLA, T. SPOUSTA, J. VOBORNÝ, S. BÁBOR, P. JURKOVIČ, P. ČECHAL, J.
Český název
Užití TOF - LEIS a XPS ke studiu povrchů.
Anglický název
Application of TOF - LEIS and XPS for Surface Studies.
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
en
Originální abstrakt
In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.
Český abstrakt
V příspěvku je popsáno komplementární použití analýz TOF – LEIS a XPS ke studiu povrchů tenkých vrstev.
Anglický abstrakt
In the contribution complementary experiments on analysis of surfaces using time-of-flight low energy ion scattering (TOF-LEIS) and x-ray photoelectron spectroscopy (XPS) will be presented. The attention will be paid both to analysis of surfaces and ultra-thin films (e.g. Ga) prepared in situ under UHV conditions. The advantages of simultaneous application of two complementary techniques to surface analysis will be clearly demonstrated.
Klíčová slova anglicky
SIMS, TOF
Rok RIV
2002
Vydáno
27.06.2001
Nakladatel
Vutium
Místo
Brno
ISBN
80-214-1892-3
Kniha
Materials Structure & Micromechanics of Fracture (MSMF-3)
Počet stran
8
BIBTEX
@inproceedings{BUT6287,
author="Stanislav {Průša} and Tomáš {Šikola} and Jiří {Spousta} and Stanislav {Voborný} and Petr {Bábor} and Patrik {Jurkovič} and Jan {Čechal},
title="Application of TOF – LEIS and XPS for Surface Studies.",
booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
year="2001",
month="June",
publisher="Vutium",
address="Brno",
isbn="80-214-1892-3"
}