Results of Research and Development
Holographic confocal microscopy
Publication Year: 2002
CHMELÍK, R. HARNA, Z. ANTOŠOVÁ, I. LOVICAR, L. MACHÁLEK, M. ZLÁMALOVÁ, M.
In situ measurements of surface homogeneity of optical parameters of weakly absorbing thin films
Publication Year: 2002
SPOUSTA, J., ŠIKOLA, T., ZLÁMAL, J., URBÁNEK, M., NAVRÁTIL, K., JIRUŠE, J., CHMELÍK, R., NEBOJSA, A.
Influence of Magnetism on Results of Ab Initio Calculations of Mechanical Properties of Crystals
Publication Year: 2002
ČERNÝ, M., ŠANDERA, P., POKLUDA, J., ŠOB, M.
Intense XUV emission generated by a capillary discharge based apparatus.
Publication Year: 2002
TOMASSETTI, G. RITUCCI A. KUKHLEVSKY, S.V. KAISER, J. PALLADINO, L. REALE, L. FLORA, F. MEZI, L. KOZMA, I. Z. LIMONGI, T. SAMEK, O. LIŠKA, M.
Investigation of pulse characteristics of 46,9 nm Ar capillary discharge soft x-ray laser.
Publication Year: 2002
RITUCCI, A. –TOMASSETTI, G. –PALLADINO, L. –REALE, L. –GAETA, G. –FLORA, F. –MEZI, L. –KUKHLEVSKY, S.V. –KAISER, J. –FAENOV, A. –PIKUZ, T.
Kvantifikace detekční účinnosti detektoru sekundárních elektronů v REM.
Publication Year: 2002
KONVALINA I.
Low-temperature epitaxial growth of the quaternary wide band gap semiconductor SiCAlN
Publication Year: 2002
ROUČKA, R., TOLLE, J., CROZIER, P., CHIZMESHYA, A., TSONG, I., KOUVETAKIS, J., POWELEIT, C., SMITH, D.
Low-temperature epitaxial growth of the quaternary wide band gap semiconductor SiCAlN
Publication Year: 2002
ROUČKA, R., TOLLE, J., CROZIER, P., CHIZMESHYA, A., TSONG, I., KOUVETAKIS, J., POWELEIT, C., SMITH, D.
Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates
Publication Year: 2002
ROUČKA, R., TOLLE, J., CROZIER, P., TSONG, I., KOUVETAKIS, J., SMITH, D.
Low-temperature growth of SiCAlN films of high hardness on Si(111) substrates
Publication Year: 2002
ROUČKA, R., TOLLE, J., CROZIER, P., TSONG, I., KOUVETAKIS, J., SMITH, D.
New method for the complete analysis of thin films non-uniform in optical parameters
Publication Year: 2002
OHLÍDAL, M., OHLÍDAL, I., FRANTA, D., ČUDEK, V.
Noncontact three-dimensional surface profiling using reflected light holographic confocal microscopy
Publication Year: 2002
ANTOŠOVÁ, I., HARNA, Z.
Optical characterization of thin films non-uniform in thickness by a multiple-wavelength reflectance method
Publication Year: 2002
OHLÍDAL, M., OHLÍDAL, I., FRANTA, D., KRÁLÍK, T., JÁKL, M., ELIÁŠ, M.
Simple Calculation of Geometrical Shielding at Intergranular Crack Front by Means of Pyramidal Model
Publication Year: 2002
ŠANDERA, P., HORNÍKOVÁ, J., POKLUDA, J.
Showed 1036–1050 from 1289 results