Results of Research and Development
Surface Measurement by a Holographic Confocal Microscope
Publication Year: 2003
CHMELÍK, R., HARNA, Z., LOVICAR, L., ANTOŠOVÁ, I.
Surface profilometry by a holographic confocal microscopy
Publication Year: 2003
CHMELÍK, R., LOVICAR, L., HARNA, Z.
System for measuring of unhomogenity of optical parameters of thin films.
Publication Year: 2003
URBÁNEK, M., SPOUSTA, J., NAVRÁTIL, K., BUČEK, M., NEUGEBAUER, P., ŠIKOLA, T.
Theoretical comparsion of optical traps created by standing wave and single beam
Publication Year: 2003
ZEMÁNEK, P., JONÁŠ, A., JÁKL, P., JEŽEK, J., ŠERÝ, M., LIŠKA, M.
TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111)
Publication Year: 2003
KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BAUER, P., ŠIKOLA, T.
3D Morphology of Fracture Surfaces in Bending-Torsion Fatigue.
Publication Year: 2003
SLÁMEČKA, K. SABIROV, I. POKLUDA, J. PIPPAN, R.
3D Statistical Characteristics of Grain Size in Ultra Fine Grained Ceramics.
Publication Year: 2003
ŠANDERA, P. POKLUDA, J. HORNÍKOVÁ, J.
3D Statistical Characteristics of Grain Size in Ultra-Fine Grained Ceramics
Publication Year: 2003
POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.
A Study of Thin Oxide Films by Ellipsometry and AR XPS
Publication Year: 2002
TICHOPÁDEK, P., ŠIKOLA, T., NEBOJSA, A., NAVRÁTIL, K., ČECHAL, J., JURKOVIČ, P., BÁBOR, P.
Ab initio Calculations of Theoretical Strength of Copper under Uniaxial Tension
Publication Year: 2002
ČERNÝ, M. ŠOB, M. ŠANDERA, P. POKLUDA, J.
Ab initio Calculations of Theoretical Strength of Copper under Uniaxial Tension
Publication Year: 2002
ČERNÝ, M. ŠOB, M. ŠANDERA, P. POKLUDA, J.
Application of AFM in Microscopy and in Fabrication of Micro/Nanostructures
Publication Year: 2002
LOPOUR, F., ŠIKOLA, T., SPOUSTA, J., ŠKODA, D., MATĚJKA, F., KALOUSEK, R.
Application of SPM in surface studies and nanotechnology
Publication Year: 2002
ŠIKOLA, T., LOPOUR, F., BÁBOR, P., BUŠ, V., ŠKODA, D., DUARTE, J.
Showed 1021–1035 from 1301 results